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VLSI Aging: BTI, HCI 與 EOL Timing 解析

深次微米製程下的晶片老化與時序影響

在 VLSI（超大型積體電路）的可靠度（Reliability）與時序分析（Timing Analysis）領域中，晶片會隨著長時間操作而發生電

Posted by Eirik on Thursday, August 6, 2026

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